Revisiting the separation dependent surface enhanced Raman scattering

Applied Physics Letters

Volumn 93, Issue 17, 2008, Pages

  Liu, Y J ^a   Zhang, Z Y ^a   Zhao, Q ^a   Zhao, Y P ^a  

^a UNIVERSITY OF GEORGIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ISOMERS; METHOD OF MOMENTS; SEPARATION; SILICON; SUBSTRATES; THREE DIMENSIONAL; TIME DOMAIN ANALYSIS;

COUPLING EFFECTS; EDGE ENHANCEMENTS; ELECTRIC FIELD ENHANCEMENTS; ENHANCED RAMAN SCATTERINGS; FINITE-DIFFERENCE TIME-DOMAIN METHODS; RAMAN MODES; RAMAN PEAKS; SI SUBSTRATES; SURFACE ENHANCED RAMAN SCATTERINGS;

RAMAN SCATTERING;

EID: 55149102659     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3009301     Document Type: Article

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