Quantitative comparison of five SERS substrates: Sensitivity and limit of detection

Applied Spectroscopy

Volumn 51, Issue 7, 1997, Pages 994-1001

  Norrod, Karen L ^a   Sudnik, Leo M ^a   Rousell, David ^a   Rowlen, Kathy L ^a  

^a UNIVERSITY OF COLORADO   (United States)

Author keywords

Limit of detection; Sensitivity; Silver; Substrates; Surface enhanced Raman spectroscopy

Indexed keywords

ANNEALING; ELECTROCHEMICAL ELECTRODES; RAMAN SPECTROSCOPY; SENSITIVITY ANALYSIS; SILVER; SUBSTRATES; SURFACE ROUGHNESS; TITANIUM DIOXIDE; VAPOR DEPOSITION;

SURFACE ENHANCED RAMAN SPECTROSCOPY (SERS); TOLENS REACTION;

METALLIC FILMS;

EID: 0031186539     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/0003702971941377     Document Type: Review

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