Orientation relationship of polycrystalline Pd-doped SnO2 thin film deposits on sapphire substrates

Thin Solid Films

Volumn 517, Issue 2, 2008, Pages 550-553

  Kwon, Ji Hwan ^a   Choi, Yun Hyuk ^a   Kim, Dai Hong ^a   Yang, Myeong ^a   Jang, Jiyoung ^a   Kim, Tae Woong ^a   Hong, Seong Hyeon ^a   Kim, Miyoung ^a  

^a Seoul National University   (South Korea)

Author keywords

In plane relationship; SnO2 thin films; Transmission electron microscopy; X ray pole figures

Indexed keywords

ALUMINUM; CORUNDUM; ELECTRON MICROSCOPES; EPITAXIAL FILMS; MAGNETRON SPUTTERING; MICROSCOPIC EXAMINATION; OXIDE MINERALS; PALLADIUM; POLES; SAPPHIRE; THICK FILMS; THIN FILMS; TITANIUM OXIDES;

DEPOSITED FILMS; EPITAXIAL RELATIONSHIPS; IN-PLANE RELATIONSHIP; MAGNETRON SPUTTERING METHODS; ORIENTATION RELATIONSHIPS; ORIENTED FILMS; PLANE ORIENTATIONS; POLE FIGURES; POLYCRYSTALLINE; RUTILE STRUCTURES; SAPPHIRE SUBSTRATES; SNO2 THIN FILMS; X-RAY POLE FIGURES;

SUBSTRATES;

EID: 55049125454     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.06.074     Document Type: Article

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