|
Volumn 205, Issue 5, 2008, Pages 1053-1055
|
Preparation of 3 inch freestanding GaN substrates by hydride vapor phase epitaxy with void-assisted separation
|
Author keywords
[No Author keywords available]
|
Indexed keywords
BASE SUBSTRATES;
CARRIER DENSITIES;
DISLOCATION DENSITIES;
FREESTANDING GAN SUBSTRATES;
GAN LAYERS;
GAN SUBSTRATES;
HYDRIDE VAPOR PHASE EPITAXIES;
ION MASS SPECTROMETRIES;
LIMIT OF DETECTIONS;
REPRODUCIBILITY;
SEPARATION METHODS;
SEPARATION PROCESSES;
SI CONCENTRATIONS;
CARRIER CONCENTRATION;
CIVIL AVIATION;
CONCENTRATION (PROCESS);
CRYSTAL GROWTH;
GALLIUM NITRIDE;
HIGH PERFORMANCE LIQUID CHROMATOGRAPHY;
ISOMERS;
MASS SPECTROMETRY;
PHASE SEPARATION;
SEMICONDUCTING GALLIUM;
SEMICONDUCTING GALLIUM COMPOUNDS;
SEMICONDUCTING SILICON COMPOUNDS;
SEPARATION;
SILICON;
SUBSTRATES;
VAPOR PHASE EPITAXY;
VAPORS;
GALLIUM ALLOYS;
|
EID: 54849441920
PISSN: 18626300
EISSN: 18626319
Source Type: Journal
DOI: 10.1002/pssa.200778431 Document Type: Article |
Times cited : (17)
|
References (8)
|