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Volumn 80, Issue 19, 2008, Pages 7226-7238

Principal component analysis: A versatile method for processing and investigation of XPS spectra

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BINDING ENERGY; DATA PROCESSING; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; PHOTOELECTRON SPECTROSCOPY; PRINCIPAL COMPONENT ANALYSIS; STATISTICAL METHODS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 54749114066     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac8005878     Document Type: Article
Times cited : (17)

References (27)
  • 1
    • 3042631462 scopus 로고    scopus 로고
    • In Surface Analysis by Auger and X-ray Photoelectron Spectroscopy; Briggs, D
    • Grant, J. T, Eds, Chichester
    • Briggs, D. In Surface Analysis by Auger and X-ray Photoelectron Spectroscopy; Briggs, D., Grant, J. T., Eds.; IM Publications and Surface Spectra Ltd.: Chichester, 2003; pp 31-56..
    • (2003) IM Publications and Surface Spectra Ltd , pp. 31-56
    • Briggs, D.1
  • 16
    • 54749085298 scopus 로고    scopus 로고
    • MATLAB 7.2.0.232 (R2006a), The MathWorks Inc., Natick, 2006.
    • MATLAB 7.2.0.232 (R2006a), The MathWorks Inc., Natick, 2006.
  • 17
    • 54749136509 scopus 로고    scopus 로고
    • CasaXPS 2.3.13 Dev55, Casa Software Ltd., Devon, 2007.
    • CasaXPS 2.3.13 Dev55, Casa Software Ltd., Devon, 2007.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.