An AFM, XPS and wettability study of the surface heterogeneity of PS/PMMA-r-PMAA demixed thin films

Journal of Colloid and Interface Science

Volumn 319, Issue 1, 2008, Pages 63-71

  Zuyderhoff, Emilienne M ^a   Dekeyser, Caroline M ^a   Rouxhet, Paul G ^a   Dupont Gillain, Christine C ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

AFM; Demixed film; PMMA r PMAA; Polymer blend; PS; Selective dissolution; Wettability; XPS

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISSOLUTION; POLYMER BLENDS; POLYMETHYL METHACRYLATES; POLYSTYRENES; THIN FILMS; WETTING; X RAY PHOTOELECTRON SPECTROSCOPY;

DEMIXED FILMS; SELECTIVE DISSOLUTION;

POLYMER FILMS;

POLY(METHYL METHACRYLATE); POLYMETHACRYLIC ACID; POLYSTYRENE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CONTACT ANGLE; DISSOLUTION; FILM; PRIORITY JOURNAL; SURFACE PROPERTY; WETTABILITY; X RAY PHOTOELECTRON SPECTROSCOPY;

MICROSCOPY, ATOMIC FORCE; POLYMETHYL METHACRYLATE; POLYSTYRENES; SPECTROPHOTOMETRY; SURFACE PROPERTIES; WATER; X-RAYS;

EID: 37849029929     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2007.11.007     Document Type: Article

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