Application of XPS and factor analysis for non-conducting materials

Surface and Interface Analysis

Volumn 25, Issue 12, 1997, Pages 942-947

  Oswald, S ^a   Baunack, S ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Charging effects; Depth profiling; Factor analysis; XPS

Indexed keywords

ELECTRIC CHARGE; MATHEMATICAL TECHNIQUES;

CHARGING EFFECTS; DEPTH PROFILING; FACTOR ANALYSIS; MULTIVARIATE MATHEMATICAL METHODS; SPECTRA CONCATENATION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0031276624     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199711)25:12<942::AID-SIA335>3.0.CO;2-A     Document Type: Article

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