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Volumn 78, Issue 16, 2008, Pages

Low-temperature irradiation-induced defects in germanium: In situ analysis

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EID: 54549083384     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.165202     Document Type: Article
Times cited : (39)

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