Electrochemical and spectroscopic characterization of surface sol-gel processes

Langmuir

Volumn 20, Issue 20, 2004, Pages 8762-8767

  Chen, Xiaohong ^a   Wilson, George S ^a  

^a UNIVERSITY OF KANSAS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR IMPRINTING; NANOPARTICLES; SOL-GEL FILMS; XEROGELS;

CROSSLINKING; ELECTROCHEMISTRY; FILM GROWTH; GELATION; SELF ASSEMBLY; SILANES; SPECTROSCOPIC ANALYSIS; SURFACE PHENOMENA;

SOL-GELS;

POLY(METHYL METHACRYLATE); POLYSTYRENE DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTROCHEMISTRY; GEL; KINETICS; SPECTROSCOPY; SURFACE PROPERTY;

ELECTROCHEMISTRY; GELS; KINETICS; MICROSCOPY, ATOMIC FORCE; POLYMETHYL METHACRYLATE; POLYSTYRENES; SPECTRUM ANALYSIS; SURFACE PROPERTIES;

CROSS LINKING; ELECTROCHEMISTRY; GELATION; GELS; MONOLAYERS; SILANES; SPECTROCHEMICAL ANALYSIS; SURFACE PROPERTIES;

EID: 5444235822     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la034940j     Document Type: Article

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