Determination of the position of V 4+ as minor component in XPS spectra by difference spectra

Applied Surface Science

Volumn 133, Issue 3, 1998, Pages 221-224

  Chen, Yongsheng ^a   Xie, Kan ^a   Liu, Zhen Xiang ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

Vanadium oxide; X ray photoelectron spectroscopy (XPS)

Indexed keywords

OXIDES; X RAY PHOTOELECTRON SPECTROSCOPY;

VANADIUM OXIDE;

VANADIUM COMPOUNDS;

EID: 0032121939     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00202-5     Document Type: Article

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