Photon energy dependence of contrast in photoelectron emission microscopy of Si devices

Applied Physics Letters

Volumn 78, Issue 22, 2001, Pages 3547-3549

  Ballarotto, V W ^a   Siegrist, K ^a   Phaneuf, R J ^a   Williams, E D ^a   Yang, W C ^b   Nemanich, R J ^b  

^a LABORATORY FOR PHYSICAL SCIENCES   (United States)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035926662     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1376151     Document Type: Article

References (13)

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