Free-radical pathways in operational degradation of OLEDs

Journal of the Society for Information Display

Volumn 16, Issue 1, 2008, Pages 37-46

  Kondakov, Denis Y ^a   Pawlik, Thomas D ^a   Nichols, William F ^a   Lenhart, William C ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

Bond dissociation; Homolysis; Operational degradation mechanism

Indexed keywords

BOND DISSOCIATION; BOND DISSOCIATION ENERGIES; BOND DISSOCIATIONS; CHEMICAL COMPOSITIONS; DEGRADATION MECHANISMS; DEGRADATION PROCESSES; DEVICE PHYSICS; ELECTRON PARAMAGNETIC RESONANCES; HOMOLYSIS; OLED DEVICES; OPERATIONAL DEGRADATION MECHANISM; OPERATIONAL STABILITIES; RADIATIVE RECOMBINATIONS; RADICAL ADDITIONS; RADICAL MECHANISMS; RADICAL PATHWAYS; RADICAL SPECIES; STATE ENERGIES;

CHEMICAL ANALYSIS; CHEMICAL BONDS; DISSOCIATION; ELECTRON RESONANCE; EXCITED STATES; FREE RADICALS; HELMET MOUNTED DISPLAYS; LIGHT EMISSION; LUMINESCENCE; ORGANIC LIGHT EMITTING DIODES (OLED); PARAMAGNETIC RESONANCE; PARAMAGNETISM;

DEGRADATION;

EID: 54149107620     PISSN: 10710922     EISSN: None     Source Type: Journal    
DOI: 10.1889/1.2835032     Document Type: Conference Paper

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