Planar defects in layered hydroxides: Simulation and structure refinement of β-nickel hydroxide

Materials Research Bulletin

Volumn 43, Issue 12, 2008, Pages 3227-3233

  Ramesh, T N ^a   Kamath, P Vishnu ^a  

^a BANGALORE UNIVERSITY   (India)

Author keywords

A. Layered compounds; B. Chemical synthesis; C. X ray diffraction; D. Defects

Indexed keywords

CHEMICAL COMPOUNDS; NICKEL ALLOYS; SYNTHESIS (CHEMICAL);

A. LAYERED COMPOUNDS; B. CHEMICAL SYNTHESIS; C. X-RAY DIFFRACTION; D. DEFECTS; LAYERED HYDROXIDES; NICKEL HYDROXIDES; PLANAR DEFECTS; RESIDUAL STACKING; STACKING SEQUENCES; STRUCTURE REFINEMENTS;

STACKING FAULTS;

EID: 54049113910     PISSN: 00255408     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.materresbull.2008.02.024     Document Type: Article

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