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Volumn 99, Issue 1-2, 2001, Pages 15-25

On the misuse of the crystal structure model of the Ni electrode material

Author keywords

Ni(OH)2; NiOOH; Float charging; Ni electrode; TEM; XRD

Indexed keywords

CRYSTAL STRUCTURE; NICKEL CADMIUM BATTERIES; NICKEL COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0035421699     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-7753(00)00676-5     Document Type: Article
Times cited : (9)

References (23)
  • 9
    • 85070144450 scopus 로고    scopus 로고
    • International Centre for Diffraction Data (ICDD), Newton Square, PA, USA


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.