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Volumn , Issue SUPPL. 8, 2008, Pages

Atomic force microscopy (AFM)

Author keywords

AFM; Force curves; Imaging

Indexed keywords

BIOSURFACTANT;

EID: 54049100755     PISSN: 19348525     EISSN: 19348533     Source Type: Journal    
DOI: 10.1002/9780471729259.mc02c02s8     Document Type: Review
Times cited : (39)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.