Probing microbial cell surface charges by atomic force microscopy

Langmuir

Volumn 18, Issue 25, 2002, Pages 9937-9941

  Ahimou, François ^a   Denis, Frédéric A ^a   Touhami, Ahmed ^a   Dufrêne, Yves F ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

BIOPHYSICS; CELL ADHESION; CELL SURFACE CHARGE; ELECTROSTATIC PROPERTIES; MICROELECTROPHORESIS; YEAST CELLS;

CHEMICAL MODIFICATION; MICROBIOLOGY; MICROORGANISMS; PHYSICAL PROPERTIES; SURFACE STRUCTURE; TITRATION;

ATOMIC FORCE MICROSCOPY;

EID: 0037059164     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la026273k     Document Type: Article

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