Interface as the origin of ferromagnetism in cobalt doped ZnO film grown on silicon substrate

Applied Physics Letters

Volumn 93, Issue 14, 2008, Pages

  Yin, Z G ^a   Chen, N F ^a   Li, Y ^b   Zhang, X W ^a   Bai, Y M ^a   Chai, C L ^a   Xie, Y N ^c   Zhang, J ^c  

^a INSTITUTE OF SEMICONDUCTORS   (China)

^b UNIVERSITY OF PUERTO RICO   (Puerto Rico)

^c INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT COMPOUNDS; FERROMAGNETISM; MAGNETIC ANISOTROPY; MAGNETIC MATERIALS; MAGNETIC PROPERTIES; MAGNETRON SPUTTERING; SEMICONDUCTING ZINC COMPOUNDS; SILICON; TRANSITION METALS; ZINC; ZINC ALLOYS; ZINC OXIDE;

CHEMICAL ETCHING; CO IONS; COBALT-DOPED ZNO; MAGNETIC PRECIPITATES; MAGNETIC PROPERTIES OF CO; OXIDE INTERFACES; SILICON SUBSTRATES;

COBALT;

EID: 53649097867     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2989128     Document Type: Article

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