-
1
-
-
0029732375
-
IBM Experiment in Soft Fails in Computer Electronics (1978-1994)
-
J.Ziegler et al., "IBM Experiment in Soft Fails in Computer Electronics (1978-1994)", IBM J. R&D, Vol. 40, No. 1, pp. 3-18, 1996.
-
(1996)
IBM J. R&D
, vol.40
, Issue.1
, pp. 3-18
-
-
Ziegler, J.1
-
2
-
-
84936893976
-
Using Heavy-Ion Radiation to Validate Fault Handling Mechanisms
-
J. Karlsson et al., "Using Heavy-Ion Radiation to Validate Fault Handling Mechanisms", IEEE Micro, Vol. 14, No. 1, pp. 8-32, 1994.
-
(1994)
IEEE Micro
, vol.14
, Issue.1
, pp. 8-32
-
-
Karlsson, J.1
-
3
-
-
0029751926
-
Accelerate Testing for Cosmic Soft-error Rate
-
J.Ziegler et al., "Accelerate Testing for Cosmic Soft-error Rate", IBM J. R&D, Vol. 40, No. 1, pp. 51-72, 1996.
-
(1996)
IBM J. R&D
, vol.40
, Issue.1
, pp. 51-72
-
-
Ziegler, J.1
-
4
-
-
0141836929
-
Comparison of Physical and Software Implemented Fault Injection Techniques
-
Sept
-
J.Arlat et al., "Comparison of Physical and Software Implemented Fault Injection Techniques", IEEE trans. on Computers, Vol. 52, No. 9, pp. 1115-1133, Sept. 2003.
-
(2003)
IEEE trans. on Computers
, vol.52
, Issue.9
, pp. 1115-1133
-
-
Arlat, J.1
-
5
-
-
29344439647
-
Asymmetries in Soft-Error Rates in a Large Cluster System
-
Sept
-
K.Harris, "Asymmetries in Soft-Error Rates in a Large Cluster System", IEEE J. of Dev & Mat. Reliability, Vol. 5, No. 3, pp. 336-342, Sept. 2005.
-
(2005)
IEEE J. of Dev & Mat. Reliability
, vol.5
, Issue.3
, pp. 336-342
-
-
Harris, K.1
-
6
-
-
33749982387
-
Using Physical and Simulated Fault Injection to Evaluate Error Detection Mechanisms
-
Dec
-
C.Constantinescu, "Using Physical and Simulated Fault Injection to Evaluate Error Detection Mechanisms", Pacific Rim Intl. Sym.. on Dependable Computing 1999. pp. 186-192, Dec. 1999.
-
(1999)
Pacific Rim Intl. Sym.. on Dependable Computing 1999
, pp. 186-192
-
-
Constantinescu, C.1
-
7
-
-
0037333293
-
Experimental Evaluation of Error-Detection Mechanisms
-
Mar
-
C.Constantinescu, "Experimental Evaluation of Error-Detection Mechanisms", IEEE trans. on Reliability, Vol. 52, No.1, pp. 53-57, Mar. 2003.
-
(2003)
IEEE trans. on Reliability
, vol.52
, Issue.1
, pp. 53-57
-
-
Constantinescu, C.1
-
8
-
-
67449117181
-
IBM POWER6 Processor Soft Error Tolerance Analysis Using Proton Irradiation
-
Apr
-
J.Kellington et al., "IBM POWER6 Processor Soft Error Tolerance Analysis Using Proton Irradiation", SELSE 3 workshop, Apr. 2007
-
(2007)
SELSE 3 workshop
-
-
Kellington, J.1
-
10
-
-
70349717877
-
Accelerated Testing of a SPARC64 V Microprocessor for Neutron SER
-
Apr
-
H.Ando et al, "Accelerated Testing of a SPARC64 V Microprocessor for Neutron SER", SELSE 3 workshop, Apr. 2007
-
(2007)
SELSE 3 workshop
-
-
Ando, H.1
-
11
-
-
21644463896
-
Comprehensive study of soft errors in advanced CMOS circuits with 90/130 nm technology
-
Tech. dig. pp, Dec
-
Y.Tosaka et al., "Comprehensive study of soft errors in advanced CMOS circuits with 90/130 nm technology", IEEE International Electron Device Meeting 2004, Tech. dig. pp. 941-944, Dec. 2004.
-
(2004)
IEEE International Electron Device Meeting
, pp. 941-944
-
-
Tosaka, Y.1
-
12
-
-
0042694184
-
Fujitsu's New SPARC64 V for Mission-Critical Servers
-
Oct
-
A.Inoue "Fujitsu's New SPARC64 V for Mission-Critical Servers", Microprocessor Forum 2002, Oct. 2002.
-
(2002)
Microprocessor Forum 2002
-
-
Inoue, A.1
-
13
-
-
10744221866
-
A 1.3GHz Fifth Generation SPARC64 Microprocessor
-
Nov
-
H.Ando, Y.Yoshida et. al "A 1.3GHz Fifth Generation SPARC64 Microprocessor", IEEE J.SSC, Vol.38, Issue 11, pp.1896-1905, Nov. 2003.
-
(2003)
IEEE J.SSC
, vol.38
, Issue.11
, pp. 1896-1905
-
-
Ando, H.1
Yoshida, Y.2
et., al.3
-
14
-
-
53349141000
-
Test Method for Beam Accelerated Soft Error Rate JESD89-3
-
Sept
-
JEDEC Standard, "Test Method for Beam Accelerated Soft Error Rate JESD89-3", Sept. 2005
-
(2005)
-
-
JEDEC Standard1
|