The fractional Talbot effect in differential x-ray phase-contrast imaging for extended and polychromatic x-ray sources

Journal of Microscopy

Volumn 232, Issue 1, 2008, Pages 145-157

  Engelhardt, M ^a,b   Kottler, C ^c   Bunk, O ^c   David, C ^c   Schroer, C ^d   Baumann, J ^a   Schuster, M ^a   Pfeiffer, F ^c,e  

^a SIEMENS AG   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^e EPFL   (Switzerland)

Author keywords

Grating interferometry; Phase retrieval; Talbot effect; X ray microscopy

Indexed keywords

DIFFRACTION GRATINGS; ELECTRON SOURCES; IMAGE ENHANCEMENT; PHASE MEASUREMENT; X RAY APPARATUS;

FRACTIONAL TALBOT EFFECT; GRATING INTERFEROMETRY; PHASE RETRIEVAL; PHYSICAL PARAMETERS; POLYCHROMATIC X-RAYS; SOURCE SIZES; TALBOT EFFECTS; X RAY MICROSCOPY; X-RAY PHASE-CONTRAST IMAGING; X-RAY SOURCES;

INTERFEROMETERS;

ARTICLE; DIFFERENTIAL X RAY PHASE CONTRAST IMAGING; ENERGY; IMAGE QUALITY; IMAGING; INTERFEROMETER; PRIORITY JOURNAL; SIMULATION; TALBOT EFFECT;

EID: 52649120735     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.02072.x     Document Type: Article

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