Measurement and modeling of drain current thermal noise to shot noise ratio in 90nm CMOS

2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systms - Digest of Papers, SiRF

Volumn , Issue , 2008, Pages 118-121

  Cui, Yan ^a,b   Niu, Guofu ^b   Rezvani, Ali ^a   Taylor, Stewart S ^c  

^a RFMD Scotts Valley Design Center   (United States)

^b AUBURN UNIVERSITY   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

CMOS; Noise modeling; Shot noise; Thermal noise

Indexed keywords

ELECTRIC CURRENTS; ELECTRONICS INDUSTRY; INTEGRATED CIRCUITS; MONOLITHIC INTEGRATED CIRCUITS; NONMETALS; RADIOFREQUENCY SPECTROSCOPY; SILICON; THERMAL NOISE;

AND MODELING; CMOS; CMOS TECHNOLOGIES; CURRENT DEPENDENCES; DRAIN VOLTAGES; EXPERIMENTAL EVIDENCE; EXPERIMENTAL MEASUREMENTS; I-V CURVES; NOISE ESTIMATIONS; NOISE MODELING; RF SYSTEMS; SHOT NOISE; SIMPLE MODELING; WEAK INVERSIONS;

DRAIN CURRENT;

EID: 52049087381     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SMIC.2008.36     Document Type: Conference Paper

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