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Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA
Volumn , Issue , 2008, Pages
Failure analysis matrix of light emitting diodes for general lighting applications
Author keywords

[No Author keywords available]
Indexed keywords

ELECTRIC NETWORK ANALYSIS; ELECTRONICS INDUSTRY; FAILURE ANALYSIS; IMAGING TECHNIQUES; INTEGRATED CIRCUITS; LIGHT EMISSION; LIGHT EMITTING DIODES; LIGHT SOURCES; LIGHTING; QUALITY ASSURANCE; SAFETY FACTOR; TECHNICAL PRESENTATIONS;
EID: 51949119305     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IPFA.2008.4588215     Document Type: Conference Paper
Times cited : (7)
References (7)
  • 1
    • 0030672999 scopus 로고    scopus 로고
    • D. L. Barton, M. Osinski, P. Perlin, C. J. Helms, N. H. Berg, Life tests and failure mechanisms of GaN/AlGaN/InGaN light emittingdiodes, IRPS 1997, 8-10 Apr. 1997, pp. 276-281.
    • D. L. Barton, M. Osinski, P. Perlin, C. J. Helms, N. H. Berg, "Life tests and failure mechanisms of GaN/AlGaN/InGaN light emittingdiodes," IRPS 1997, 8-10 Apr. 1997, pp. 276-281.
  • 2
    • 0036927759 scopus 로고    scopus 로고
    • G. Meneghesso, et. al., Degradation mechanisms of GaN-based LEDs after accelerated DC current ag-ing, IEDM 2002, 8-11 Dec. 2002, pp. 103-106.
    • G. Meneghesso, et. al., "Degradation mechanisms of GaN-based LEDs after accelerated DC current ag-ing," IEDM 2002, 8-11 Dec. 2002, pp. 103-106.
  • 3
    • 31044444581 scopus 로고    scopus 로고
    • Analysis of DC current accelerated life tests of GaN LEDs using a Weibull-based statistical model
    • Dec
    • S. Levada, M. Meneghini, G. Meneghesso, E. Zanoni, "Analysis of DC current accelerated life tests of GaN LEDs using a Weibull-based statistical model," IEEE Trans. on Device and Materials Reliability, vol. 5, issue 4, Dec. 2005, pp. 688-693.
    • (2005) IEEE Trans. on Device and Materials Reliability , vol.5 , Issue.4 , pp. 688-693
    • Levada, S.1    Meneghini, M.2    Meneghesso, G.3    Zanoni, E.4
  • 4
    • 34948858362 scopus 로고    scopus 로고
    • Analysis of Dark Stain on Chip Surface of High-Power LED
    • 26-29 Aug
    • F. Wu, Y. Wu, B. An, F. Wu, "Analysis of Dark Stain on Chip Surface of High-Power LED," ICEPT '06, 26-29 Aug. 2006, pp. 1-4.
    • (2006) ICEPT '06 , pp. 1-4
    • Wu, F.1    Wu, Y.2    An, B.3    Wu, F.4
  • 5
    • 51949089453 scopus 로고    scopus 로고
    • M. Meneghini, L. R. Trevisanello, S. Levada, G. Me-neghesso, G. Tamiazzo, E.; Zanoni, T. Zahner, U. Zehnder, V. Harle, U. Straus, Failure mechanisms of gallium nitride LEDs related with passivation, IEDM 2005, 5-7 Dec. 2005, pp. 4-7.
    • M. Meneghini, L. R. Trevisanello, S. Levada, G. Me-neghesso, G. Tamiazzo, E.; Zanoni, T. Zahner, U. Zehnder, V. Harle, U. Straus, "Failure mechanisms of gallium nitride LEDs related with passivation," IEDM 2005, 5-7 Dec. 2005, pp. 4-7.
  • 6
    • 0031680440 scopus 로고    scopus 로고
    • D. L. Barton, M. Osinski, P. Perlin, P. G. Eliseev, J. Lee, Degradation of single-quantum well InGaN green light emitting diodes under high electrical stress, IRPS 1998, 31 Mar. 1998, pp. 119-123.
    • D. L. Barton, M. Osinski, P. Perlin, P. G. Eliseev, J. Lee, "Degradation of single-quantum well InGaN green light emitting diodes under high electrical stress," IRPS 1998, 31 Mar. 1998, pp. 119-123.
  • 7
    • 84954052924 scopus 로고    scopus 로고
    • N. Hwang, P. S. R. Naidu, A. Trigg, Failure analysis of plastic packaged optocoupler light emitting di-odes, EPTC 2003, 10-12 Dec. 2003, pp. 346-349.
    • N. Hwang, P. S. R. Naidu, A. Trigg, "Failure analysis of plastic packaged optocoupler light emitting di-odes," EPTC 2003, 10-12 Dec. 2003, pp. 346-349.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.