Degradation of single-quantum well InGaN green light emitting diodes under high electrical stress

Annual Proceedings - Reliability Physics (Symposium)

Volumn , Issue , 1998, Pages 119-123

  Barton, Daniel L ^a   Osinski, Marek ^a   Perlin, Piotr ^a   Eliseev, Petr G ^a   Lee, Jinhyun ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC CURRENTS; ELECTRIC DISCHARGES; ELECTRODES; FAILURE ANALYSIS; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS;

HIGH ELECTRICAL STRESS;

LIGHT EMITTING DIODES;

EID: 0031680440     PISSN: 00999512     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/relphy.1998.670460     Document Type: Conference Paper

References (7)