Finite element modeling for temperature stabilization of gated Hall sensors

Journal of Applied Physics

Volumn 104, Issue 5, 2008, Pages

  Jouault, B ^a,b   Bouguen, L ^a,b   Contreras, S ^a,b   Kerlain, A ^c   Mosser, V ^c  

^a UNIV MONTPELLIER   (France)

^b CNRS   (France)

^c ITRON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; HALL EFFECT DEVICES; SENSORS;

ANALYTICAL CALCULATIONS; ANALYTICAL METHODS; EXPERIMENTAL MEASUREMENTS; EXTERNAL-; FINITE ELEMENT ANALYSIS; FINITE ELEMENT MODELING; HALL SENSORS; HALL VOLTAGES; METROLOGICAL APPLICATIONS; NUMERICA L RESULTS; NUMERICAL ERRORS; TEMPERATURE RANGES; TEMPERATURE STABILIZATION;

FINITE ELEMENT METHOD;

EID: 51849111899     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2968436     Document Type: Article

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