Intellectual property authentication by watermarking scan chain in design-for-testability flow

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2008, Pages 2645-2648

  Cui, Aijiao ^a   Chang, Chip Hong ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

ACCESS CONTROL; ARSENIC COMPOUNDS; AUTHENTICATION; DESIGN; DESIGN FOR TESTABILITY; INTELLECTUAL PROPERTY; INTERNET PROTOCOLS; NUCLEAR PROPULSION; SCANNING; TECHNICAL PRESENTATIONS; WATERMARKING;

SCAN CELLS; SCAN CHAINS;

DIGITAL WATERMARKING;

EID: 51749119655     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2008.4542000     Document Type: Conference Paper

References (12)

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