Half-metallicity in europium oxide conductively matched with silicon

Physical Review B - Condensed Matter and Materials Physics

Volumn 78, Issue 12, 2008, Pages

  Panguluri, Raghava P ^a   Santos, T S ^b,d   Negusse, E ^c   Dvorak, J ^c   Idzerda, Y ^c   Moodera, J S ^b   Nadgorny, B ^a,b  

^a WAYNE STATE UNIVERSITY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c MONTANA STATE UNIVERSITY   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 51749115323     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.78.125307     Document Type: Article

References (48)

1. Y. D. Ohno, K. Young, B. Beschoten, F. Matsukura, H. Ohno, and D. D. Awschalom, Nature (London) NATUAS 0028-0836 10.1038/45509 402, 790 (1999).
2. I. Zutic, J. Fabian, and S. Das Sarma, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.76.323 76, 323 (2004).
3. S. A. Wolf, D. D. Awschalom, R. A. Buhrman, J. M. Daughton, S. von Molnar, M. L. Roukes, A. Y. Chtchelkanova, and D. M. Treger, Science SCIEAS 0036-8075 10.1126/science.1065389 294, 1488 (2001)
4. Semiconductor Spintronics and Quantum Computation, edited by, D. D. Awschalom,,, D. Loss,, and, N. Samarth, (Springer-Verlag, Berlin, 2002).
5. J. M. Kikkawa and D. D. Awschalom, Nature (London) 397, 139141 (1999). 0028-0836
6. R. Fiederling, M. Keim, G. Reuscher, W. Ossau, G. Schmidt, A. Waag, and L. W. Molenkamp, Nature (London) NATUAS 0028-0836 10.1038/45502 402, 787 (1999).
7. B. T. Jonker, Y. D. Park, B. R. Bennett, H. D. Cheong, G. Kioseoglou, and A. Petrou, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.8180 62, 8180 (2000).
8. S. A. Crooker, M. Furis, X. Lou, C. Adelmann, D. L. Smith, C. J. Palmstrom, and P. A. Crowell, Science SCIEAS 0036-8075 10.1126/science.1116865 309, 2191 (2005).
9. H. Ohno, Science SCIEAS 0036-8075 10.1126/science.281.5379.951 281, 951 (1998).
10. I. Zutic, J. Fabian, and S. C. Erwin, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.97.026602 97, 026602 (2006).
11. A. M. Tyryshkin, S. A. Lyon, A. V. Astashkin, and A. M. Raitsimring, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.193207 68, 193207 (2003).
12. G. Schmidt, D. Ferrand, L. W. Molenkamp, A. T. Filip, and B. J. van Wees, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.R4790 62, R4790 (2000)
13. M. Johnson and R. H. Silsbee, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.35.4959 35, 4959 (1987).
14. E. I. Rashba, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.R16267 62, R16267 (2000).
15. S. S. P. Parkin, C. Kaiser, A. Panchula, P. M. Rice, B. Hughes, M. Samant, and S.-H. Yang, Nat. Mater. NMAACR 1476-1122 10.1038/nmat1256 3, 862 (2004).
16. T. S. Santos and J. S. Moodera, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.69.241203 69, 241203 (2004).
17. I. Appelbaum, B. Huang, and D. Monsma, Nature (London) NATUAS 0028-0836 10.1038/nature05803 447, 295 (2007).
18. B. T. Jonker, G. Kioseoglou, A. T. Hanbicki, C. H. Li, and P. E. Thompson, Nat. Phys. ZZZZZZ 1745-2473 3, 542 (2007).
19. B. T. Matthias, R. M. Bozorth, and J. H. van Fleck, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.7.160 7, 160 (1961).
20. P. G. Steeneken, L. H. Tjeng, I. Elfimov, G. A. Sawatzky, G. Ghiringhelli, N. B. Brookes, and D.-J. Huang, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.88.047201 88, 047201 (2002).
21. G. Petrich, S. von Molnar, and T. Penney, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.26.885 26, 885 (1971).
22. M. R. Oliver, J. A. Kafalas, J. O. Dimmock, and T. B. Reed, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.24.1064 24, 1064 (1970)
23. M. R. Oliver, J. O. Dimmock, A. L. McWorther, and T. B. Reed, Phys. Rev. B PLRBAQ 0556-2805 10.1103/PhysRevB.5.1078 5, 1078 (1972).
24. Y. Shapira, S. Foner, and T. B. Reed, Phys. Rev. B PLRBAQ 0556-2805 10.1103/PhysRevB.8.2299 8, 2299 (1973).
25. R. von Helmolt, J. Wecker, B. Holzapfel, L. Schultz, and K. Samwer, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.71.2331 71, 2331 (1993).
26. S. Jin, T. H. Tiefel, M. Mc Cormack, R. A. Fastnacht, R. Ramesh, and L. H. Chen, Science SCIEAS 0036-8075 10.1126/science.264.5157.413 264, 413 (1994).
27. K. J. Hubbard and D. G. Schlom, J. Mater. Res. JMREEE 0884-2914 10.1557/JMR.1996.0350 11, 2757 (1996).
28. R. J. Soulen, Jr., J. M. Byers, M. S. Osofsky, B. Nadgorny, T. Ambrose, S. F. Cheng, P. R. Broussard, C. T. Tanaka, J. Nowak, J. S. Moodera, A. Barry, and J. M. D. Coey, Science SCIEAS 0036-8075 10.1126/science.282.5386.85 282, 85 (1998).
29. S. K. Upadhyay, A. Palanisami, R. N. Louie, and R. A. Buhrman, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.81.3247 81, 3247 (1998).
30. A. Anguelouch, A. Gupta, G. Xiao, G. X. Miao, D. W. Abraham, S. Ingvarsson, Y. Ji, and C. L. Chien, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1455604 91, 7140 (2002).
31. J. S. Parker, S. M. Watts, P. G. Ivanov, and P. Xiong, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.88.196601 88, 196601 (2002).
32. A. A. F. Andreev, Sov. Phys. JETP 19, 1228 (1964). 0038-5646
33. M. J. M. de Jong and C. W. J. Beenakker, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.74.1657 74, 1657 (1995).
34. I. I. Mazin, A. A. Golubov, and B. Nadgorny, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1357127 89, 7576 (2001).
35. P. Chalsani, S. K. Upadhyay, O. Ozatay, and R. A. Buhrman, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.75.094417 75, 094417 (2007).
36. To measure the temperature dependence of EuO single film would require the use of a lithographically defined sample on a different (high resistivity) Si substrate.
37. We note that, due the metal insulator transition, the low temperature carrier density of conducting EuO is relatively insensitive to the resistivity and is generally on the order of 1019 electrons/ cm3.
38. M. F. Merriam and V. Von Herzen, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.131.637 131, 637 (1963).
39. A. A. Golubov, E. P. Houwman, J. G. Gijsbertsen, V. M. Krasnov, J. Flokstra, H. Rogalla, and M. Yu. Kupriyanov, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.51.1073 51, 1073 (1995).
40. B. Nadgorny, I. I. Mazin, M. Osofsky, R. J. Soulen, Jr., P. Broussard, R. M. Stroud, D. J. Singh, V. G. Harris, A. Arsenov, and Yu. Mukovskii, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.63.184433 63, 184433 (2001).
41. G. T. Woods, R. J. Soulen, I. Mazin, B. Nadgorny, M. S. Osofsky, J. Sanders, H. Srikanth, W. F. Egelhoff, and R. Datla, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.054416 70, 054416 (2004).
42. J. Aumentado and V. Chandrashekar, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.054505 64, 054505 (2001).
43. T. R. McGuire and M. W. Shafer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1713568 35, 984 (1964).
44. The XAS measurements were conducted at the MSU Nanomaterial X-ray Characterization Facility located at beamline U4B at the National Synchrotron Light Source and at the soft x-ray undulator beamline 4.0.2 at the Advance Light Source. The measurements were done in total electron yield mode, using linearly polarized light with energy resolution of 0.4 eV.
45. B. T. Thole, G. van der Laan, J. C. Fuggle, G. A. Sawatzky, R. C. Karnatak, and J. M. Esteva, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.32. 5107 32, 5107 (1985).
46. G. Kaindl, G. Kalkowski, W. D. Brewer, B. Perscheid, and F. Holtzberg, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.333517 55, 1910 (1984).
47. J. Holroyd, Y. U. Idzerda, and S. Stadler, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1688653 95, 6571 (2004).
48. A. Schmehl, V. Vaithyanathan, A. Herrnberger, S. Thiel, C. Richter, M. Liberati, T. Heeg, M. Rockerath, L. F. Kourkoutis, S. Muhlbauer, P. Boni, D. A. Muller, Y. Barash, J. Schubert, Y. Idzerda, J. Mannhart, and D. G. Schlom, Nat. Mater. NMAACR 1476-1122 10.1038/nmat2012 6, 882 (2007).