메뉴 건너뛰기




Volumn , Issue , 2008, Pages 1780-1783

Noise model, analysis and characterization of a differential active pixel sensor

Author keywords

[No Author keywords available]

Indexed keywords

COPYING; IMAGE SENSORS; PIXELS; PROCESS ENGINEERING; TECHNICAL PRESENTATIONS;

EID: 51749102412     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2008.4541784     Document Type: Conference Paper
Times cited : (2)

References (13)
  • 1
    • 0033690157 scopus 로고    scopus 로고
    • Low noise readout using active reset for CMOS APS
    • B. Fowler, M. D. Godfrey, J. Balicki, and J. Canfield, "Low noise readout using active reset for CMOS APS," Proc. of SPIE, vol. 3965, pp.126-135, 2000
    • (2000) Proc. of SPIE , vol.3965 , pp. 126-135
    • Fowler, B.1    Godfrey, M.D.2    Balicki, J.3    Canfield, J.4
  • 2
    • 0036927969 scopus 로고    scopus 로고
    • Reset noise suppression in two-dimension CMOS photodiode pixels through column-based feedback-reset
    • B. Pain, T. J. Cunningham, B. Hancock, G. Yang, S. Seshadri, and M. Ortiz, "Reset noise suppression in two-dimension CMOS photodiode pixels through column-based feedback-reset," Tech. Dig. IEDM, pp. 809-812, 2002
    • (2002) Tech. Dig. IEDM , pp. 809-812
    • Pain, B.1    Cunningham, T.J.2    Hancock, B.3    Yang, G.4    Seshadri, S.5    Ortiz, M.6
  • 3
    • 4444231877 scopus 로고    scopus 로고
    • CMOS active pixel sensor achieving 90 dB dynamic range with column-level active reset
    • Y. Chen, S. Kleinfelder, "CMOS active pixel sensor achieving 90 dB dynamic range with column-level active reset," Proc. of SPIE, vol. 5301, pp. 438-449, 2004
    • (2004) Proc. of SPIE , vol.5301 , pp. 438-449
    • Chen, Y.1    Kleinfelder, S.2
  • 4
    • 1942519190 scopus 로고    scopus 로고
    • Noise sources and noise suppression in CMOS imagers
    • B. Pain, T. J. Cunningham, and B. Hancock, "Noise sources and noise suppression in CMOS imagers,"Proc. of SPIE, vol. 5167, pp. 111-120, 2004
    • (2004) Proc. of SPIE , vol.5167 , pp. 111-120
    • Pain, B.1    Cunningham, T.J.2    Hancock, B.3
  • 5
    • 8344269520 scopus 로고    scopus 로고
    • Novel Integrated CMOS Sensor Circuits
    • S. Kleinfelder, et al., "Novel Integrated CMOS Sensor Circuits," IEEE Trans. Nuc. Sci., vol. 51, pp. 2328-2336, 2004
    • (2004) IEEE Trans. Nuc. Sci , vol.51 , pp. 2328-2336
    • Kleinfelder, S.1
  • 6
    • 51749118930 scopus 로고    scopus 로고
    • A 3Mpixel Low-Noise Flexible Architecture CMOS Image Sensor
    • Feb. 6-9
    • J. Yang et al. "A 3Mpixel Low-Noise Flexible Architecture CMOS Image Sensor" IEEE ISSC, pp. 2004-2013, Feb. 6-9, 2006
    • (2006) IEEE ISSC , pp. 2004-2013
    • Yang, J.1
  • 7
    • 0034478407 scopus 로고    scopus 로고
    • A 256x256 CMOS Differential Passive Pixel Imager with FPN Reduction Techniques
    • Dec
    • I. L. Fujimori, C. Wang, C. G. Sodini, "A 256x256 CMOS Differential Passive Pixel Imager with FPN Reduction Techniques" IEEE Solid-State Circuits, vol. 35, no. 12, Dec. 2000
    • (2000) IEEE Solid-State Circuits , vol.35 , Issue.12
    • Fujimori, I.L.1    Wang, C.2    Sodini, C.G.3
  • 8
    • 33644657678 scopus 로고    scopus 로고
    • A 0.18um CMOS Bioluminescence Detection Lab-on-Chip
    • March
    • H. Eltoukhy, K. Salama, A. El Gamal, "A 0.18um CMOS Bioluminescence Detection Lab-on-Chip" IEEE Solid-State Circuits, vol. 41, no. 3, March 2006
    • (2006) IEEE Solid-State Circuits , vol.41 , Issue.3
    • Eltoukhy, H.1    Salama, K.2    El Gamal, A.3
  • 9
    • 0035111662 scopus 로고    scopus 로고
    • Analysis of temporal noise in CMOS photodiode active pixel sensor
    • Jan
    • H. Tian, B. Fowler, A. El Gamal, "Analysis of temporal noise in CMOS photodiode active pixel sensor," IEEE Journal of Solid-State Circuits, vol. 36, no. 1, pp. 92-101, Jan. 2001
    • (2001) IEEE Journal of Solid-State Circuits , vol.36 , Issue.1 , pp. 92-101
    • Tian, H.1    Fowler, B.2    El Gamal, A.3
  • 12
    • 0035340018 scopus 로고    scopus 로고
    • 1/f Noise in CMOS Transistors for Analog Applications
    • May
    • Y Nemirovsky, I Brouk, C Jakobson, "1/f Noise in CMOS Transistors for Analog Applications," IEEE Trans on Electron Devices, vol. 48, no. 5, pp. 921927, May 2001.
    • (2001) IEEE Trans on Electron Devices , vol.48 , Issue.5 , pp. 921927
    • Nemirovsky, Y.1    Brouk, I.2    Jakobson, C.3
  • 13
    • 0032225255 scopus 로고    scopus 로고
    • Method for estimating quantum efficiency for CMOS image sensors
    • B. A. Fowler, A. El Gamal, D. Yang, H, Tian. "Method for estimating quantum efficiency for CMOS image sensors," Proc. SPIE vol. 3301, pp. 178-185, 1998.
    • (1998) Proc. SPIE , vol.3301 , pp. 178-185
    • Fowler, B.A.1    El Gamal, A.2    Yang, D.3    Tian, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.