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Volumn 5167, Issue , 2004, Pages 111-120

Noise Sources and Noise Suppression in CMOS Imagers

Author keywords

CMOS imager; CTIA; Dark current; Feedback reset; Noise; Spatial noise

Indexed keywords

CMOS IMAGERS; CTIA; DARK-CURRENTS; FEEDBACK-RESET; SPATIAL NOISE;

EID: 1942519190     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.512281     Document Type: Conference Paper
Times cited : (9)

References (13)
  • 1
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    • Optimization of active pixel sensor noise and responsivity for scientific applications
    • O. Yadid-Pecht, B. Mansoorian, E.R. Fossum and B. Pain, "Optimization of active pixel sensor noise and responsivity for scientific applications," Proc. SPIE vol. 3019, pp. 125-136, 1997.
    • (1997) Proc. SPIE , vol.3019 , pp. 125-136
    • Yadid-Pecht, O.1    Mansoorian, B.2    Fossum, E.R.3    Pain, B.4
  • 2
    • 0035111662 scopus 로고    scopus 로고
    • Analysis of temporal noise in CMOS photodiode active pixel sensor
    • T. Hui, B. Fowler, A.E. Gamal, "Analysis of temporal noise in CMOS photodiode active pixel sensor," IEEE J. Solid State Circuits, vol. SC-36, pp. 92-101, 2001.
    • (2001) IEEE J. Solid State Circuits , vol.SC-36 , pp. 92-101
    • Hui, T.1    Fowler, B.2    Gamal, A.E.3
  • 3
    • 29744450559 scopus 로고    scopus 로고
    • Analysis and reduction of signal readout circuitry temporal noise in CMOS image sensors for low-light-levels
    • Y. Degerli, F. Lavernhe, P. Magnan, J. Farre, "Analysis and reduction of signal readout circuitry temporal noise in CMOS image sensors for low-light-levels," IEEE Trans. Electron Devices, vol. ED-47, pp. 949-962, 2000
    • (2000) IEEE Trans. Electron Devices , vol.ED-47 , pp. 949-962
    • Degerli, Y.1    Lavernhe, F.2    Magnan, P.3    Farre, J.4
  • 5
    • 0033707839 scopus 로고    scopus 로고
    • Analysis of 1/f noise in CMOS APS
    • H. Tian and A. El Gamal, "Analysis of 1/f noise in CMOS APS," Proc. SPIE 3965, pp. 168-176, 2000.
    • (2000) Proc. SPIE , vol.3965 , pp. 168-176
    • Tian, H.1    El Gamal, A.2
  • 8
    • 0033690157 scopus 로고    scopus 로고
    • Low noise readout using active reset for CMOS APS
    • B. Fowler, M. Godfrey, J. Balicki, and J. Canfield, "Low noise readout using active reset for CMOS APS," Proc. SPIE 3965, pp. 126-135, 2000.
    • (2000) Proc. SPIE , vol.3965 , pp. 126-135
    • Fowler, B.1    Godfrey, M.2    Balicki, J.3    Canfield, J.4
  • 13
    • 0026819795 scopus 로고
    • A new recombination model for device simulation including tunneling
    • G.A.M. Hurkx, D.B.M. Klaassen, and M.P.G. Knuvers, "A new recombination model for device simulation including tunneling," IEEE Trans. Electron Devices, vol. ED-39, pp. 331-338, 1992.
    • (1992) IEEE Trans. Electron Devices , vol.ED-39 , pp. 331-338
    • Hurkx, G.A.M.1    Klaassen, D.B.M.2    Knuvers, M.P.G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.