CMOS active pixel sensor achieving 90 dB dynamic range with column-level active reset

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5301, Issue , 2004, Pages 438-449

  Chen, Yandong ^a   Kleinfelder, Stuart ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

APS; CMOS image sensor; Column level active reset; Noise reduction

Indexed keywords

AMPLIFICATION; CHARGE COUPLED DEVICES; ELECTRON ABSORPTION; FEEDBACK AMPLIFIERS; IMAGE SENSORS; LIGHT AMPLIFIERS; NOISE ABATEMENT; PATTERN RECOGNITION; PHOTODIODES; SIGNAL PROCESSING;

APS; CMOS IMAGE SENSORS; COLOMN LEVEL ACTIVE TEST; DIGITAL SIGNALS; ELECTRON DRAIN;

CMOS INTEGRATED CIRCUITS;

EID: 4444231877     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.527111     Document Type: Conference Paper

References (8)

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