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Volumn , Issue , 2008, Pages 388-391

Low variation current source for 90nm CMOS

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; ELECTRIC NETWORK TOPOLOGY; NETWORKS (CIRCUITS); TECHNICAL PRESENTATIONS;

EID: 51749094399     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISCAS.2008.4541436     Document Type: Conference Paper
Times cited : (5)

References (7)
  • 1
    • 0036474722 scopus 로고    scopus 로고
    • Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration
    • Feb
    • Keith A. Bowman, Steven G. Duvall and James D. Meindl, "Impact of die-to-die and within-die parameter fluctuations on the maximum clock frequency distribution for gigascale integration," IEEE Journal of Solid-State Circuits, vol. 37, pp. 183-190, Feb 2002.
    • (2002) IEEE Journal of Solid-State Circuits , vol.37 , pp. 183-190
    • Bowman, K.A.1    Duvall, S.G.2    Meindl, J.D.3
  • 4
    • 34748924961 scopus 로고    scopus 로고
    • Process Invariant Current Source Design: Methodology and Examples
    • Oct
    • A. Pappu, X. Zhang, A. Harrison, and A. Apsel, "Process Invariant Current Source Design: Methodology and Examples," IEEE Journal of Solid State Circuits, vol. 42, No. 10, pp. 2293-2302, Oct. 2007.
    • (2007) IEEE Journal of Solid State Circuits , vol.42 , Issue.10 , pp. 2293-2302
    • Pappu, A.1    Zhang, X.2    Harrison, A.3    Apsel, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.