Where CMOS is going: Trendy hype vs. real technology

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn , Issue , 2006, Pages

  Cher, Tze Chiang ^a,b  

^a IBM   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE STRUCTURES; SCALING THEORY; SILICON TECHNOLOGY;

ENERGY DISSIPATION; INNOVATION; SCALING LAWS; SILICON; TRANSISTORS;

CMOS INTEGRATED CIRCUITS;

EID: 39749162082     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (40)