Accurate and analytical statistical spatial correlation modeling for vlsi DFM applications

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 694-697

  Liu, Jui Hsiang ^a   Tsai, Ming Feng ^a   Chen, Lumdo ^b   Chen, Charlie Chung Ping ^a  

^a NATIONAL TAIWAN UNIVERSITY   (Taiwan)

^b UNITED MICROELECTRONICS CORPORATION   (Taiwan)

Author keywords

Process variation; Spatial correlation; SSTA

Indexed keywords

PROCESS VARIATION; SPATIAL CORRELATION; SSTA;

COMPUTER AIDED DESIGN; DIGITAL INTEGRATED CIRCUITS; INDUSTRIAL ENGINEERING; STATISTICAL METHODS;

CORRELATION METHODS;

EID: 51549113214     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555908     Document Type: Conference Paper

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