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Volumn , Issue , 2008, Pages 48-51

Experimental demonstration of 3.3kV planar CIGBT in NPT technology

Author keywords

[No Author keywords available]

Indexed keywords

CLUSTERED INSULATED GATE BIPOLAR TRANSISTOR; INTERNATIONAL SYMPOSIUM; POWER SEMICONDUCTOR DEVICES;

EID: 51549088379     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISPSD.2008.4538894     Document Type: Conference Paper
Times cited : (19)

References (8)
  • 1
    • 51549108219 scopus 로고    scopus 로고
    • th IWPSD, 1999, pp. 1307-1312
    • th IWPSD, 1999, pp. 1307-1312
  • 2
    • 0035302845 scopus 로고    scopus 로고
    • Clustered insulated gate bipolar transistor: A new power semiconductor device
    • IEE Pro.-Circuits Devices Syst, April
    • M. Sweet, O. Spulber, J. V.Subhas Chandra Bose, L.Ngwendson, K.V.Vershinin, M.M.De Souza and E.M.Sankara Naravanan, "Clustered insulated gate bipolar transistor: a new power semiconductor device", IEE Pro.-Circuits Devices Syst , Vol. I48. No. 2, April 2001, pp. 75-78
    • (2001) , vol.I48 , Issue.2 , pp. 75-78
    • Sweet, M.1    Spulber, O.2    Subhas Chandra Bose, J.V.3    Ngwendson, L.4    Vershinin, K.V.5    Souza, M.M.D.6    Sankara Naravanan, E.M.7
  • 7
    • 34247499543 scopus 로고    scopus 로고
    • K. Vershinin, M. Sweet, L. Ngwendson, Jim Thomson, P. Waind, J. Bruce and E. M. Sankara Narayanan: Experimental Demonstration of a 1.2kV Trench Clustered Insulated Gate Bipolar Transistor in Non-Punch-Through Technology, ISPSD 2006
    • K. Vershinin, M. Sweet, L. Ngwendson, Jim Thomson, P. Waind, J. Bruce and E. M. Sankara Narayanan: "Experimental Demonstration of a 1.2kV Trench Clustered Insulated Gate Bipolar Transistor in Non-Punch-Through Technology", ISPSD 2006


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.