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Volumn 2006, Issue , 2006, Pages
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Experimental demonstration of a 1.2kV trench clustered insulated gate bipolar transistor in non punch through technology
a a a b b c a |
Author keywords
[No Author keywords available]
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Indexed keywords
DUMMY CELLS;
NON PUNCH THROUGH TECHNOLOGY;
ELECTRIC POTENTIAL;
ENERGY DISSIPATION;
VOLTAGE CONTROL;
INSULATED GATE BIPOLAR TRANSISTORS (IGBT);
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EID: 34247499543
PISSN: 10636854
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (15)
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References (4)
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