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Volumn 2006, Issue , 2006, Pages

Experimental demonstration of a 1.2kV trench clustered insulated gate bipolar transistor in non punch through technology

Author keywords

[No Author keywords available]

Indexed keywords

DUMMY CELLS; NON PUNCH THROUGH TECHNOLOGY;

EID: 34247499543     PISSN: 10636854     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (15)

References (4)
  • 2
    • 4944240005 scopus 로고    scopus 로고
    • K. Vershinin, M. Sweet, O. Spulber, S. Hardikar, N. Luther-King, M. M. De Souza, S. Sverdloff and E. M. S. Narayanan, Influence of the design parameters on the performance of 1.7 kV, NPT, planar Clustered Insulated Gate Bipolar Transistor (CIGBT), ISPSD'04, pp. 269-272, 2004.
    • K. Vershinin, M. Sweet, O. Spulber, S. Hardikar, N. Luther-King, M. M. De Souza, S. Sverdloff and E. M. S. Narayanan, "Influence of the design parameters on the performance of 1.7 kV, NPT, planar Clustered Insulated Gate Bipolar Transistor (CIGBT)", ISPSD'04, pp. 269-272, 2004.
  • 3
    • 0042014501 scopus 로고    scopus 로고
    • O. Spulber, M. Sweet, K. Vershinin, N. Luther-King, E. M. Sankara-Narayanan, M. M. De Souza, D. Flores, J. Millan, 1.7kV NPT V-groove clustered IGBT: fabrication and experimental demonstration, ISPSD'03, pp. 345-348.
    • O. Spulber, M. Sweet, K. Vershinin, N. Luther-King, E. M. Sankara-Narayanan, M. M. De Souza, D. Flores, J. Millan, "1.7kV NPT V-groove clustered IGBT: fabrication and experimental demonstration", ISPSD'03, pp. 345-348.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.