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Volumn 57, Issue 3, 2008, Pages 431-434

A log-logistic step-stress model

Author keywords

Accelerated life test; Asymptotic variance; Confidence interval; Fisher information matrix; Log logistic life distribution; Maximum likelihood estimation; Step stress test

Indexed keywords

BUILDING MATERIALS; TESTING;

EID: 51449123848     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2008.928182     Document Type: Article
Times cited : (17)

References (13)
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    • Nelson, W.B.1
  • 3
    • 0020734526 scopus 로고
    • Optimum simple step-stress plans for accelerated life testing
    • R. Miller and W. B. Nelson, "Optimum simple step-stress plans for accelerated life testing," IEEE Trans. Reliability, vol. R-32, pp. 59-65, 1983.
    • (1983) IEEE Trans. Reliability , vol.R-32 , pp. 59-65
    • Miller, R.1    Nelson, W.B.2
  • 4
    • 0024891878 scopus 로고
    • Optimum simple step-stress accelerated life tests with censoring
    • D. S. Bai, M. S. Kim, and S. H. Lee, "Optimum simple step-stress accelerated life tests with censoring," IEEE Trans. Reliability, vol. 38, pp. 528-532, 1989.
    • (1989) IEEE Trans. Reliability , vol.38 , pp. 528-532
    • Bai, D.S.1    Kim, M.S.2    Lee, S.H.3
  • 6
    • 85011670954 scopus 로고    scopus 로고
    • An alternative to the Weibull cumulative exposure model
    • American Statistical Association, Chicago, Aug
    • I. H. Khamis and J. J. Higgins, "An alternative to the Weibull cumulative exposure model," in 1996 Proc. Section on Quality & Productivity, American Statistical Association, Chicago, Aug. 1996.
    • (1996) 1996 Proc. Section on Quality & Productivity
    • Khamis, I.H.1    Higgins, J.J.2
  • 9
    • 0032083940 scopus 로고    scopus 로고
    • A new model for step-stress testing
    • I. H. Khamis and J. J. Higgins, "A new model for step-stress testing," IEEE Trans. Reliability, vol. 47, no. 2, pp. 131-134, 1998.
    • (1998) IEEE Trans. Reliability , vol.47 , Issue.2 , pp. 131-134
    • Khamis, I.H.1    Higgins, J.J.2
  • 10
    • 33845580025 scopus 로고    scopus 로고
    • The log-logistic model for Reliability characterization of power system components subjected to random stress
    • CAPRI, Italy, Jun
    • E. Chiodo and G. Mazzanti, "The log-logistic model for Reliability characterization of power system components subjected to random stress," in SPEEDAM, CAPRI, Italy, Jun. 2004, pp. 239-244.
    • (2004) SPEEDAM , pp. 239-244
    • Chiodo, E.1    Mazzanti, G.2
  • 11
    • 0036599712 scopus 로고    scopus 로고
    • Optimal simple step-stress plan for Khamis-Higgins Model
    • A. A. Alhadeed and S. S. Yang, "Optimal simple step-stress plan for Khamis-Higgins Model," IEEE Trans. Reliability, vol. 51, no. 2, pp. 212-215, 2002.
    • (2002) IEEE Trans. Reliability , vol.51 , Issue.2 , pp. 212-215
    • Alhadeed, A.A.1    Yang, S.S.2
  • 12
    • 0017972683 scopus 로고
    • Theory for optimum censored life tests for weibull and extreme value distribution
    • W. B. Nelson and W. Q. Meeker, "Theory for optimum censored life tests for weibull and extreme value distribution," Technometrics, vol. 20, pp. 171-177, 1978.
    • (1978) Technometrics , vol.20 , pp. 171-177
    • Nelson, W.B.1    Meeker, W.Q.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.