New FM detection techniques for scanning probe microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 7 B, 2004, Pages 4566-4570

  Kobayashi, Dai ^a   Kawai, Shigeki ^b   Kawakatsu, Hideki ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

AFM; Direct conversion; FM demodulation; Hilbert transformer; Nanocantilever

Indexed keywords

DEMODULATION; FEEDBACK; FREQUENCY MODULATION; GAIN CONTROL; MATHEMATICAL TRANSFORMATIONS; RESONANCE; SIGNAL PROCESSING;

AFM; DIRECT CONVERSION; FM DEMODULATION; HILBERT TRANSFORMER; NANOCANTILEVER;

ATOMIC FORCE MICROSCOPY;

EID: 5144223336     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.4566     Document Type: Conference Paper

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