Evolution of electric field amplitude dependent scaling behaviors in ferroelectric films over a broad temperature range

Applied Physics Letters

Volumn 93, Issue 9, 2008, Pages

  Yang, J ^a   Meng, X J ^a   Shen, M R ^b   Gao, C ^a   Sun, J L ^a   Chu, J H ^a,c  

^a SHANGHAI INSTITUTE OF TECHNICAL PHYSICS   (China)

^b SOOCHOW UNIVERSITY   (China)

^c EAST CHINA NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; ELECTRIC FIELD EFFECTS; ELECTRIC FIELDS; FERROELECTRIC MATERIALS; FERROELECTRICITY; HYSTERESIS; LEAD; MANGANESE; MANGANESE COMPOUNDS; OXYGEN; OXYGEN VACANCIES; TITANIUM OXIDES;

DYNAMIC HYSTERESIS; ELECTRIC-FIELD AMPLITUDES; FERROELECTRIC DOMAINS;

FERROELECTRIC FILMS;

EID: 51349149482     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2978329     Document Type: Article

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26. Wloss =4 0 1/4f iudt, where Wloss is the Joule loss, leakage current i=Su/d, u is the measure voltage, f is the measure frequency, S is the area of the electrode, and d is film thickness. For triangle wave, there is a relation that t=u/4f V0, where V0 is amplitude voltage. Calculate the Wloss and the relation Wloss = (S/3df) V02 can be obtained.