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Volumn , Issue , 2008, Pages 1667-1672

Drop reliability study of PBGA assemblies with SAC305, SAC105 and SAC105-Ni solder ball on Cu-OSP and ENIG surface finish

Author keywords

[No Author keywords available]

Indexed keywords

BRAZING; COMPUTER NETWORKS; CONCENTRATION (PROCESS); COPPER; DROPS; ELECTRIC CURRENTS; ELECTRONIC EQUIPMENT MANUFACTURE; ELECTRONICS PACKAGING; FLUID MECHANICS; MECHANICAL PROPERTIES; METALLIC COMPOUNDS; NICKEL; NICKEL ALLOYS; RELIABILITY; SILVER; SURFACES; WELDING;

EID: 51349145336     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550202     Document Type: Conference Paper
Times cited : (49)

References (7)
  • 2
    • 10644231004 scopus 로고    scopus 로고
    • T.C. Chiu, K. Zeng. Effect of thermal aging on board level drop reliability for Pb-free BGA packages, in 54th Electronic Components & Technology Conference, Vols 1 and 2, Proceedings. 2004, IEEE: New York. p. 1256-1262.
    • T.C. Chiu, K. Zeng. Effect of thermal aging on board level drop reliability for Pb-free BGA packages, in 54th Electronic Components & Technology Conference, Vols 1 and 2, Proceedings. 2004, IEEE: New York. p. 1256-1262.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.