Determining thermal simulation data from transient measurements

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2008, Pages 198-202

  Janicki, Marcin ^a,b   Kindermann, Stefan ^c   Pietrzak, Piotr ^b   Vermeersch, Bjorn ^d   Banaszczyk, Jedrzej ^d   De Mey, Gilbert ^d   Napieralski, Andrzej ^b  

^a JOHANN RADON INSTITUTE FOR COMPUTATIONAL AND APPLIED MATHEMATICS   (Austria)

^b LODZ UNIVERSITY OF TECHNOLOGY   (Poland)

^c JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^d GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; HEAT RESISTANCE; HEAT TRANSFER; POWER AMPLIFIERS; SEMICONDUCTOR MATERIALS; STRUCTURAL OPTIMIZATION; THERMAL VARIABLES MEASUREMENT; TRANSFER FUNCTIONS;

HEATING CURVES; STRUCTURE FUNCTIONS; THERMAL MEASUREMENT; TIME CONSTANTS;

TRANSIENT ANALYSIS;

EID: 51349132519     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2008.4509390     Document Type: Conference Paper

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