Fine structure of heat flow path in semiconductor devices: A measurement and identification method

Solid State Electronics

Volumn 31, Issue 9, 1988, Pages 1363-1368

  Székely, Vladimir ^a   Van Bien, Tran ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER PROGRAMMING - ALGORITHMS; INTEGRATED CIRCUITS - HEAT SINKS; THERMAL CONDUCTIVITY; THERMAL VARIABLES MEASUREMENT; TRANSISTORS - ENCAPSULATION;

HEAT FLOW PATH; HEAT-SINKING PROPERTIES; SEMICONDUCTOR DEVICE CHIPS; THERMAL TRANSIENTS;

SEMICONDUCTOR DEVICES;

EID: 0024069775     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/0038-1101(88)90099-8     Document Type: Article

References (8)