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Volumn , Issue , 2008, Pages 2105-2110

Improving copper electrodeposition in the microelectronics industry

Author keywords

[No Author keywords available]

Indexed keywords

COPPER ELECTRODEPOSITION; ELECTRONIC COMPONENTS; MICROELECTRONICS INDUSTRY;

EID: 51349120730     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ECTC.2008.4550276     Document Type: Conference Paper
Times cited : (7)

References (14)
  • 3
    • 33750835306 scopus 로고    scopus 로고
    • Influence of the Anode and the Accelerator on Copper Bath Aging in the Damascene Process
    • Mocoteguy P, Gabrielli C., Perrot H. et al. "Influence of the Anode and the Accelerator on Copper Bath Aging in the Damascene Process", Journal of Electrochemical Society, Vol. 153, No. 12 (2006) pp. G1086-G1098.
    • (2006) Journal of Electrochemical Society , vol.153 , Issue.12
    • Mocoteguy, P.1    Gabrielli, C.2    Perrot, H.3
  • 4
    • 0037931966 scopus 로고    scopus 로고
    • Influence of Additives on Copper Electrodeposition on Physical Vapor Deposited (PVD) Copper Substrates
    • Kang M. and Gewirth A., "Influence of Additives on Copper Electrodeposition on Physical Vapor Deposited (PVD) Copper Substrates", Journal of Electrochemical Society, Vol. 150. No.6 (2003) pp. C426-C434.
    • (2003) Journal of Electrochemical Society , vol.150 , Issue.6
    • Kang, M.1    Gewirth, A.2
  • 5
    • 55649108206 scopus 로고    scopus 로고
    • Influence of Plating Parameters and Solution Chemistry on the Voiding Propensity at Electroplated Copper-Solder Interface
    • Submitted for publication
    • Liu, Y. et al. "Influence of Plating Parameters and Solution Chemistry on the Voiding Propensity at Electroplated Copper-Solder Interface" J Appl Electrochem, Submitted for publication 2008
    • (2008) J Appl Electrochem
    • Liu, Y.1
  • 7
    • 19944432174 scopus 로고    scopus 로고
    • Kirkendall Void Formation in Eutectic SnPb Solder Joint on Bare Cu and its Effect on Joint
    • Zeng, K. Stierman R., Chiu, T., Edwards, D. and Ano, K., "Kirkendall Void Formation in Eutectic SnPb Solder Joint on Bare Cu and its Effect on Joint ", Journal of Applied Physics 2005
    • (2005) Journal of Applied Physics
    • Zeng, K.1    Stierman, R.2    Chiu, T.3    Edwards, D.4    Ano, K.5
  • 8
    • 33644921774 scopus 로고    scopus 로고
    • Reliability of lead-free interconnec-tions under consecutive thermal and mechanical loadings, Mat-tila and Kivilahti
    • Mattila, T., and Kivilahti, J., "Reliability of lead-free interconnec-tions under consecutive thermal and mechanical loadings", Mat-tila and Kivilahti, Journal of Electronic Materials, Vol. 35, No. 2, 2006, pp. 250-256
    • (2006) Journal of Electronic Materials , vol.35 , Issue.2 , pp. 250-256
    • Mattila, T.1    Kivilahti, J.2
  • 9
    • 33845594178 scopus 로고    scopus 로고
    • Effect of Intermetallic and Kirkendall Voids Growth on Board Level Drop Reliability for SnAgCu Lead-free BGA Solder Joint
    • Xu, L., and Pang, H., "Effect of Intermetallic and Kirkendall Voids Growth on Board Level Drop Reliability for SnAgCu Lead-free BGA Solder Joint", Proceedings of Electronic Components and Technology Conference 2006, pp. 275-282
    • (2006) Proceedings of Electronic Components and Technology Conference , pp. 275-282
    • Xu, L.1    Pang, H.2
  • 13
    • 0038178132 scopus 로고    scopus 로고
    • Modeling Superconformal Electrodeposition Using The Level Set Method
    • Wheeler D., Josell D. and Moffat T. P., "Modeling Superconformal Electrodeposition Using The Level Set Method", Journal of Electrochemical Society, Vol. 150, No. 5 (2003) pp. C302-C310.
    • (2003) Journal of Electrochemical Society , vol.150 , Issue.5
    • Wheeler, D.1    Josell, D.2    Moffat, T.P.3
  • 14
    • 2342572872 scopus 로고    scopus 로고
    • Potential of zero charge of monocrystalline copper electrodes in Perchlorate solutions
    • Lukomska A., Sobkowski J., Potential of zero charge of monocrystalline copper electrodes in Perchlorate solutions, Journal of Electroanalytical Chemistry, 567 (2004) 95-102.
    • (2004) Journal of Electroanalytical Chemistry , vol.567 , pp. 95-102
    • Lukomska, A.1    Sobkowski, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.