Fast computation of temperature profiles of VLSI ICs with high spatial resolution

Annual IEEE Semiconductor Thermal Measurement and Management Symposium

Volumn , Issue , 2008, Pages 50-54

  Park, Je Hyoung ^a   Wang, Xi ^a   Shakouri, Ali ^a   Kang, Sung Mo ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Finite difference method (FDM); Finite element method (FEM); Power blurring; Power dissipation profile (power map); Temperature distribution (thermal profile); Thermal simulation

Indexed keywords

FINITE DIFFERENCE METHOD (FDM); FINITE ELEMENT METHOD (FEM); POWER BLURRING; POWER DISSIPATION PROFILE (POWER MAP); TEMPERATURE DISTRIBUTION (THERMAL PROFILE); THERMAL SIMULATION;

ATMOSPHERIC TEMPERATURE; ELECTRIC CONDUCTIVITY; INTEGRATED CIRCUITS; LEAD ALLOYS; SURFACE PROPERTIES; THERMAL VARIABLES MEASUREMENT;

TEMPERATURE CONTROL;

EID: 51349091597     PISSN: 10652221     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/STHERM.2008.4509365     Document Type: Conference Paper

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