A method to quantify the degree of uniformity of thickness of thin films

Thin Solid Films

Volumn 516, Issue 23, 2008, Pages 8493-8497

  Roncallo, S ^a   Painter, J D ^a   Cousins, M A ^a   Lane, D W ^a   Rogers, K D ^a  

^a CRANFIELD UNIVERSITY   (United Kingdom)

Author keywords

Chalcogenides; Coating uniformity; Electrospray deposition; Optical density; Surface roughness

Indexed keywords

CAMERAS; COPPER COMPOUNDS; ELECTRIC FIELDS; ELECTROSTATICS; IMAGE ANALYSIS; LIGHT SOURCES;

CHALCOGENIDES; COATING UNIFORMITY; ELECTROSPRAY DEPOSITION; OPTICAL DENSITY; SURFACE ROUGHNESS;

THICK FILMS;

EID: 51149116724     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.05.001     Document Type: Article

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