Hotspot remediation with anisotropic thermal interface materials

2008 11th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, I-THERM

Volumn , Issue , 2008, Pages 238-247

  Bachmann, Christopher ^a   Bar Cohen, Avram ^a  

^a UNIVERSITY OF MARYLAND   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS ENGINEERING;

ELECTRONIC SYSTEMS; FEATURE SIZES; HIGH HEAT FLUX; SUB-MILLIMETER;

FLUXES;

EID: 50949131389     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ITHERM.2008.4544276     Document Type: Conference Paper

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