Temperature dependence of surface composition and morphology in polymer blend film

Polymer

Volumn 49, Issue 20, 2008, Pages 4456-4461

  You, Jichun ^a   Shi, Tongfei ^a   Liao, Yonggui ^a   Li, Xinglin ^a   Su, Zhaohui ^a   An, Lijia ^a  

^a CHANGCHUN INSTITUTE OF APPLIED CHEMISTRY   (China)

Author keywords

In situ XPS; Polymer blend; Surface composition

Indexed keywords

ATOMIC FORCE MICROSCOPY; AUTOMATA THEORY; ESTERS; PHASE SEPARATION; POLYMER BLENDS; POLYMER FILMS; STYRENE; SURFACE SEGREGATION; SURFACE STRUCTURE; TEMPERATURE DISTRIBUTION; X RAY PHOTOELECTRON SPECTROSCOPY;

CRITICAL TEMPERATURES; IN-SITU XPS; POLY(METHYL METHACRYLATE) (PMMA); POLYMER-BLEND FILMS; PREFERENTIAL SEGREGATION; SITU ATOMIC FORCE MICROSCOPY; SITU X-RAY PHOTOELECTRON SPECTROSCOPY; TEMPERATURE DEPENDENCE;

THIN FILMS;

CHEMICAL COMPOSITION; FILM; MORPHOLOGY; PHASE SEPARATION; POLYACRYLONITRILE; POLYMER BLEND; POLYMETHYL METHACRYLATE; POLYSTYRENE; SURFACE PROPERTY; THERMAL TREATMENT;

EID: 50949114704     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2008.07.050     Document Type: Article

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