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Volumn 44, Issue 14, 2003, Pages 4035-4045
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Surface phase separations of PMMA/SAN blends investigated by atomic force microscopy
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Author keywords
Atomic force microscopy; PMMA SAN blends; Spinodal decomposition mechanism
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Indexed keywords
ACETONITRILE;
ANNEALING;
ATOMIC FORCE MICROSCOPY;
POLYMER BLENDS;
POLYMETHYL METHACRYLATES;
POLYSTYRENES;
SILICON WAFERS;
SOLUTIONS;
THIN FILMS;
X RAY PHOTOELECTRON SPECTROSCOPY;
SURFACE PHASE SEPARATIONS;
PHASE SEPARATION;
ACRYLONITRILE;
POLY(METHYL METHACRYLATE);
POLY(STYRENE CO ACRYLONITRILE);
SILICON;
UNCLASSIFIED DRUG;
ATOMIC FORCE MICROSCOPY;
CASTING;
FILM;
FLUORESCENCE;
PHASE SEPARATION;
ACCELERATION;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL ANALYSIS;
CHEMICAL COMPOSITION;
CHEMICAL INTERACTION;
CHEMICAL REACTION;
CHEMICAL STRUCTURE;
DECOMPOSITION;
FILM;
IMAGE ANALYSIS;
MISCIBILITY;
PHASE SEPARATION;
STRUCTURE ANALYSIS;
SURFACE PROPERTY;
SYNTHESIS;
TECHNIQUE;
TEMPERATURE DEPENDENCE;
X RAY PHOTOELECTRON SPECTROSCOPY;
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EID: 0038519448
PISSN: 00323861
EISSN: None
Source Type: Journal
DOI: 10.1016/S0032-3861(03)00316-1 Document Type: Article |
Times cited : (24)
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References (44)
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