Interface morphology snapshots of vertically segregated thin films of semiconducting polymer/polystyrene blends

Polymer

Volumn 48, Issue 8, 2007, Pages 2380-2386

  Castro, Fernando A ^a,b   Graeff, Carlos F O ^c   Heier, Jakob ^a   Hany, Roland ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

^c SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

Author keywords

MEH PPV; Polymer blends; Polymer demixing

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); MOLECULAR WEIGHT; MORPHOLOGY; OPTOELECTRONIC DEVICES; POLYMER BLENDS; POLYSTYRENES; SEMICONDUCTING POLYMERS; SPINODAL DECOMPOSITION;

INTERFACE TOPOGRAPHICAL FEATURES; MEH-PPV; MICROMETER RANGE; POLYMER DEMIXING;

THIN FILMS;

FILM; MOLECULAR WEIGHT; MORPHOLOGY; POLYMER BLEND; POLYSTYRENE; SOLVENT;

EID: 33947690277     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2007.02.059     Document Type: Article

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