Measurements of complex refractive indices of metals at several wavelengths by frustrated total internal reflection due to surface plasmon resonance

Applied Optics

Volumn 47, Issue 13, 2008, Pages 2386-2391

  Iwata, Tetsuo ^a   Komoda, Go ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INFRARED DEVICES; METALS; PLASMONS; SURFACE PLASMON RESONANCE;

COMPLEX REFRACTIVE INDEX; DIELECTRIC LAYER; DISPERSION RELATIONS; FRUSTRATED TOTAL INTERNAL REFLECTIONS; MEASUREMENT SYSTEM; MEASUREMENTS OF; METAL CONDUCTOR; NEAR-INFRARED WAVELENGTH;

REFRACTIVE INDEX;

EID: 50849122066     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.002386     Document Type: Article

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