Simulation of an absorption-based surface-plasmon resonance sensor by means of ellipsometry

Applied Optics

Volumn 46, Issue 9, 2007, Pages 1575-1582

  Iwata, Tetsuo ^a   Maeda, Shogo ^a  

^a UNIVERSITY OF TOKUSHIMA   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELLIPSOMETRY; NUMERICAL METHODS; REFRACTIVE INDEX; SENSITIVITY ANALYSIS; SURFACE PLASMON RESONANCE;

COMMON PATH POLARIZATION INTERFEROMETERS; CONVENTIONAL ENERGY REFLECTANCE; ELLIPSOMETRIC MEASUREMENT; KRETSCHMANN OPTICAL ARRANGEMENT;

OPTICAL SENSORS;

ABSORPTION; ALGORITHM; ARTICLE; CHEMICAL MODEL; COMPUTER ASSISTED DIAGNOSIS; COMPUTER SIMULATION; METHODOLOGY; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

ABSORPTION; ALGORITHMS; COMPUTER SIMULATION; IMAGE INTERPRETATION, COMPUTER-ASSISTED; MODELS, CHEMICAL; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 34247466696     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.46.001575     Document Type: Article

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