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Volumn , Issue , 2008, Pages 20-24

Plasma Doping (PD) for ultra-shallow junction

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; HELIUM; PLASMAS; RAPID THERMAL ANNEALING; RAPID THERMAL PROCESSING; SEMICONDUCTOR DOPING;

EID: 50849104575     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IWJT.2008.4540009     Document Type: Conference Paper
Times cited : (1)

References (21)
  • 1
    • 50849083250 scopus 로고    scopus 로고
    • ITRS Home Page :http://www.itrs.net/Links/2007ITRS/2007_Chapters/ 2007_FEP.pdf
    • ITRS Home Page :http://www.itrs.net/Links/2007ITRS/2007_Chapters/ 2007_FEP.pdf
  • 4
    • 0023559501 scopus 로고    scopus 로고
    • th Solid State Devices and Materials (SSDM), Tokyo, 1987, p.319.
    • th Solid State Devices and Materials (SSDM), Tokyo, 1987, p.319.
  • 13
    • 47949101007 scopus 로고    scopus 로고
    • Symp. VLSI Tech
    • Honolulu
    • T. Yamamoto, et al., 2002 Symp. VLSI Tech., Digest of Technical Papers, Honolulu, 2002, p.53.
    • (2002) Digest of Technical Papers , vol.2002 , pp. 53
    • Yamamoto, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.