Growth and characterization of ultrathin V2Oy (y ≈ 5) Films on Au(111)

Journal of Physical Chemistry C

Volumn 112, Issue 32, 2008, Pages 12363-12373

  Guimond, Sébastien ^a,b   Göbke, Daniel ^a   Romanyshyn, Yuriy ^a   Sturm, Jacobus M ^a   Naschitzki, Matthias ^a   Kuhlenbeck, Helmut ^a   Freund, Hans Joachim ^a  

^a FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^b SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; ABSORPTION SPECTROSCOPY; ELECTROMAGNETIC WAVES; ELECTRON DIFFRACTION; FILM GROWTH; GOLD; MICROSCOPIC EXAMINATION; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; MONOLAYERS; OXIDE FILMS; OXYGEN; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; TRANSITION METALS; ULTRATHIN FILMS; VANADIUM; VANADIUM COMPOUNDS;

AU (1 1 1); LOW-ENERGY ELECTRON DIFFRACTION; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 50649117293     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp8011365     Document Type: Article

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